Archives of Acoustics,
16, 1, pp. 53-72, 1991
Measurement of quartz crystal resonators and filters in the production process
The crystal manufacturing industry has been plagued by measurement problems through out its history. Producers and customers have had problems monitoring product specifications with sufficient accuracy to unsure the final product meets the customer requirement. This problem is getting more severe where manufacturers are being pushed to provide very small lot production runs with high precision and low cost. This paper outlines some practical issues present for crystal producers and users. Several directions are presented to help minimize the problem. Key among these suggestions are the use of measurement techniques, fixtures and equipment compatible with current industry standards.
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Copyright © Polish Academy of Sciences & Institute of Fundamental Technological Research (IPPT PAN).
References
Bernd W. NEUBIG, Measurements of quartz crystal units up to 500 MHz and above by the use of a PI network error correction, 11th Quartz Devices Conference (1989).
R. FISCHER, L. SCHULZKE, Direct plating to frequency, Proceedings of the 30th Annual Symposium on Frequency Control (1976).
B. MANCINI, Crystal measurement: an error analysis using the HP3577 network analyzer with S-parameters.
Transat Application Note N10379A: MCT PI network measurements, (July 18, 1983 and Fe., 1989).